【Introduction】

Environmental conditions have a great influence on the  functionality and reliability of the electronic components,  devices and systems. A normal temperature test is often  not sufficient to detect latent weak points as quickly as  possible. Samples must be subjected to multiple, shock like temperature changes. With thermal shock test  chamber extremely fast temperature changes  from –55 °C to +150 °C can be achieved. This helps you to reduce early failures and to increase the reliability of your  products. Reproducible, certified and under accelerated  conditions.

【Test Standard】

IEC 60068-2-14 Na

MIL-STD-810H,  Method 503.7

MIL-STD-883L-1,  Method 1010.9

JASO D 014-4